Fraunhofer interference and diffraction patterns from single and double slits.
References: Bayman & Hammermesh sec. 4.2; Tipler & Mosca sec. 33.5.
Version 0.2
To do:
(i) Add slits
(ii) Adjust normalization for multiple slits?
(iii) Resolve singularities at multiple slit peaks
(iv) Parameterize wavelength better/differently?
I0 – single-slit intensity; a – slit width; d – slit separation; L – wavelength (as a multiple of d); D – distance to screen (so tanT=x/D gives the position on the screen corresponding to angle T. For small angles note sinT = tanT = x/D.)
Phase difference between rays from top and bottom of each slit as a function of screen position (X):
Phase difference between rays from centers of adjacent slits as a function of screen position (X):
Intensity for single-slit diffraction pattern:
Intensity for two-slit interference-diffraction pattern (note how interference term is modulated by the single-slit diffraction pattern):
Intensity for two-slit interference pattern (neglecting diffraction):
Intensity for m-slit diffraction pattern:
Envelope for m-slit diffraction:
Location of intensity maxima as a function of position on the screen.
To plot as a function of angle replace x->Dsinx:
Bragg condition. d is now the interplanar spacing.
Author: David A. Craig <http://web.lemoyne.edu/~craigda/>
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